It is well established that transition and stuck-at fault models detect the vast majority of production defects. The transition fault model focuses on detecting timing-related defects. However, the ...
The current shift in the test methodologies is away from the ubiquitous single stuck-at fault model. The best test for any device is to exhaustively test the device. The quality of such a test would ...
A key goal in manufacturing test is to maximize the quality of parts delivered to customers—ideally, shipping zero defective parts while reducing the cost of testing those parts. The arrival of ...
Once IC fabrication is complete, engineers use fault models to create test patterns that detect defects. These fault models are typically abstractions of defect behavior based on our experience and ...
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